Physical Failure Analysis Engineer

NXP Semiconductors

Kuala Lumpur, Malaysia
Scanning electron microscope (sem)
Focused ion beam (fib)
Energy dispersive x-ray spectroscopy (edx)
Physical failure analysis (PFA) involves the localisation, imaging, and characterisation of manufacturing defects in our products

Job Summary

  • Physical failure analysis (PFA) involves the localisation, imaging, and characterisation of manufacturing defects in our products.
  • Analysts will be expected to utilise a wide variety of fault localisation and imaging tools/techniques, including but not limited to Scanning Electron Microscope (SEM), Transmission Electron Microscope (TEM), Energy Dispersive X-ray Spectroscopy (EDX), Focused Ion Beam (FIB), SEM-based Nanoprober.
  • Document findings in professional reports to be shared with various stakeholders and collaborate with cross-departmental teams such as Customer Quality Engineering, Manufacturing, and other FA labs.

Matching Summary

Physical failure analysis (PFA) involves the localisation, imaging, and characterisation of manufacturing defects in our products.

Skills & Requirements

Must-have

  • Scanning Electron Microscope (SEM)
  • Focused Ion Beam (FIB)
  • Energy Dispersive X-ray Spectroscopy (EDX)
  • Transmission Electron Microscope (TEM)
  • SEM-based Nanoprober
  • Utilise fault localisation and imaging tools

Nice-to-have

  • Strong problem solving skills
  • Attention to detail
  • Good communication skills
  • Produce quality results timely

Key Requirements

  • Bachelor's or Master's degree
  • Not more than 2 years’ work experience
  • Basic technical knowledge of semiconductor physics
  • MOSFET operations knowledge
  • Able to work with chemicals, X-Ray, Electron and Ion Beam tools
  • Comfortable with handling small and delicate samples

Work Rights

Not specified

Tailored Resume

Cover Letter