Senior Scientist (APM/Pattern Transfer/Lithography), IME

A*STAR RESEARCH ENTITIES

Singapore, Singapore
Not specified
Phd or master's degree in relevant field
10+ years r&d experience in lithography
Expertise in immersion/krf/i-line scanners
A*STAR Research Entities is seeking a Senior Scientist to lead a central lithography team focused on pattern transfer. The ideal candidate should have extensive experience in lithography processes, particularly with various substrate sizes and photolithography tools, alongside a strong background in materials science or related fields

Job Summary

  • The role involves leading a central lithography team within the pattern transfer group at A*STAR's research entity.
  • Candidates must have extensive experience handling various substrate sizes from nano to micron tech nodes.
  • The position requires acting as a subject matter expert to enable process realization for industry partners.

Matching Summary

Match Score: 85

A*STAR Research Entities is seeking a Senior Scientist to lead a central lithography team focused on pattern transfer. The ideal candidate should have extensive experience in lithography processes, particularly with various substrate sizes and photolithography tools, alongside a strong background in materials science or related fields.

Skills & Requirements

Must-have

  • PhD or Master's degree in relevant field
  • 10+ years R&D experience in lithography
  • Expertise in Immersion/KrF/I-line scanners
  • Hands-on metrology with CDSEM and Overlay
  • Experience with 6, 8, and 12 inch substrates
  • Process development and optimization skills

Nice-to-have

  • Knowledge of EBEAM Lithography tools
  • Experience with SiC/GaN/Photonics materials
  • Simulation knowledge using Prolith or OPC
  • Ability to lead small projects with manageable risks

Key Requirements

  • Ph.D/Master Degree in Materials Science or related field
  • More than 10 years relevant working experience
  • Proficiency in Photolithography tools including Immersion/Stepper
  • Hands-on experiences in metrology including CDSEM and Overlay

Work Rights

Not specified

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