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Carl Zeiss Pty Ltd is seeking a Head of Software EUV Metrology to lead R&D projects in the Semiconductor Mask Solutions business unit. The ideal candidate will have a strong background in software development, project management, and team leadership, particularly within the semiconductor industry.
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Job Summary
In the Business Unit of ZEISS Semiconductor Mask Solutions, you will take over the governance for all development projects and technology studies in the Software EUV Metrology department.
This includes the disciplinary and technical leadership of the R&D team Software EUV Metrology, active interface management, and the definition of internal qualification measures for employees, across locations in Jena and Oberkochen.
Develop complex measuring systems for the inspection of photomasks, ensure process conformity, and document all development activities.
Matching Summary
Match Score: 75
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Carl Zeiss Pty Ltd is seeking a Head of Software EUV Metrology to lead R&D projects in the Semiconductor Mask Solutions business unit. The ideal candidate will have a strong background in software development, project management, and team leadership, particularly within the semiconductor industry.
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