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Applied Materials Inc. is seeking a TEM Manager to oversee the Transmission Electron Microscopy lab operations in Santa Clara, CA. The role focuses on managing engineers and technicians, enhancing lab capabilities, and ensuring high-quality semiconductor characterization, with a strong emphasis on technical expertise and leadership.
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Job Summary
This role involves managing a team of TEM engineers and technicians to drive semiconductor characterization initiatives at Applied Materials.
The position requires deep technical expertise in advanced TEM techniques including EDS, EELS, and crystallographic analysis to support product development.
Candidates will benefit from a supportive work culture that encourages learning, professional growth, and the opportunity to push the boundaries of materials science.
Matching Summary
Match Score: 75
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Applied Materials Inc. is seeking a TEM Manager to oversee the Transmission Electron Microscopy lab operations in Santa Clara, CA. The role focuses on managing engineers and technicians, enhancing lab capabilities, and ensuring high-quality semiconductor characterization, with a strong emphasis on technical expertise and leadership.
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Salary
Base: $147,000.00 - $202,500.00; Bonus/Equity: Eligible for bonus and stock award program; Benefits: Comprehensive benefits package including health and wellbeing programs
Skills & Requirements
Must-have
Transmission Electron Microscopy (TEM) expertise
FIB sample preparation knowledge
Team leadership and management experience
Advanced TEM techniques (EDS, EELS, GPA)
Semiconductor process integration understanding
Problem-solving using data-driven approaches
Nice-to-have
Cross-functional collaboration skills
Customer interaction and escalation handling
Workflow improvement and efficiency strategies
Structured training program development
Presentation and technical communication skills
Key Requirements
Proven experience in high-volume TEM production environments
Working knowledge of FIB sample preparation
Strong understanding of semiconductor industry metrology