Sr Assoc Eng Failure Analysis

GlobalFoundries

Tem sample preparation
Focused-ion beam/scanning electron microscope
Semiconductor failure analysis
GlobalFoundries makes possible the technologies and systems that transform industries and give customers the power to shape their markets

Job Summary

  • GlobalFoundries makes possible the technologies and systems that transform industries and give customers the power to shape their markets.
  • Perform TEM (transmission electron microscopy) sample preparation using Focused-ion beam/Scanning Electron Microscope for semiconductor failure analysis and characterization.
  • GlobalFoundries is an equal opportunity employer, cultivating a diverse and inclusive workforce.

Matching Summary

GlobalFoundries makes possible the technologies and systems that transform industries and give customers the power to shape their markets.

Skills & Requirements

Must-have

  • TEM sample preparation
  • Focused-ion beam/Scanning Electron Microscope
  • semiconductor failure analysis
  • chip delayering
  • RIE etching
  • sputter coating

Nice-to-have

  • sense of urgency
  • quality mindset
  • fast learning
  • good hands-on capability
  • interpersonal and communication skills
  • team workers
  • independent and self-disciplined

Key Requirements

  • Diploma in Engineering
  • 12hr night-shift pattern
  • Hands-on experience on FIB for TEM sample preparation is preferred
  • Basic knowledge in semiconductor field

Work Rights

Not specified

Tailored Resume

Cover Letter