Job Summary

• Responsible for regular TOF-SIMS analysis to support the Semiconductor Fab Startup in Dholera (Gujrat) and support the technology bring-up by examining wafer implant profiles, dopant concentrations, surface contamination, and microimaging.
• Conduct TOF-SIMS analysis to support Facilities qualification and regular contamination analysis, also find the source of contamination on Silicon wafer, such as impurities in Ultra-pure water, chemicals and Gases.
• Work with stakeholders across departments and technology development teams to isolate the root cause of contamination or failures and drive yield improvement.

Matching Summary

Skills & Requirements

Key Requirements

• M.S or PhD in Electrical Engineering, Materials Science or equivalent
• Strong understanding of Time-of-Flight Secondary Ion mass Spectroscopy (SIMS) or Magnetic Sector SIMS
• Some understanding for CMOS Semiconductor manufacturing
• Ability to participate in cross-functional teams
• 2-3+ years’ experience in the semiconductor industry

Work Rights